Single rotated strings for THz Skin
Rot_strings01
First test with strings: different width and fillets. Frame size: \(300 \mu m\)
Wafer: 100 nm SiN, low stress
For technical reasons I started with the etching process, followed up by metal evaporation.
STEP 1
| Spin&bake | |
|---|---|
| AR 300.80 | 4000 RPM, 150°C, 1' |
| AR.P 6200.13 | 3000 RPM, 130°C, 1' |
| EBL |
|---|
| EHT: 30 kV |
| D: 140 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
| RIE |
|---|
| \(SF_6\)/\(O_2\): 32/8 sccm |
| 50 W, P = \(5 \times 10^{-2}\) mbar |
STEP 2
| Spin&bake | |
|---|---|
| AR 679.04 | 4000 RPM, 120°C, 10' |
| EBL |
|---|
| EHT: 20 kV |
| D: 240 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
I made use of several layer 63 + patches to avoid stitching
| EVAPORATION | |
|---|---|
| Ti/Au: 5/60 nm | [SZ@NEST] |
Rot_strings02
Frame size: \(300 \mu m\), wafer: 100 nm SiN, low stress
STEP 1
| Spin&bake | |
|---|---|
| AR 679.04 | 4000 RPM, 120°C, 15' |
| EBL |
|---|
| EHT: 20 kV |
| D: 240 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
I made use of several layer 63 + patches to avoid stitching
| EVAPORATION |
|---|
| Cr/Au: 5/50 nm |
STEP 2
| Spin&bake | |
|---|---|
| AR.P 6200.13 | 2000 RPM, 150°C, 1' |
| EBL |
|---|
| EHT: 30 kV |
| D: 140 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
| RIE |
|---|
| \(SF_6\)/\(O_2\): 32/8 sccm |
| 50 W, P = \(5 \times 10^{-2}\) mbar |
Rot_strings03
Frame size: \(300 \mu m\), wafer: 100 nm SiN, low stress
STEP 1
| Spin&bake | |
|---|---|
| AR 679.04 | 4000 RPM, 120°C, 15' |
| EBL |
|---|
| EHT: 20 kV |
| D: 250 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
I made use of several layer 63 + patches to avoid stitching
| EVAPORATION |
|---|
| Cr/Au: 10/43 nm |
The initial evaporation did not result in Au deposition on the sample. The sample had been placed at the center of the sample holder in the hope that it would be fully covered by the shutter in both positions 1 and 4. However, during Au deposition, the sample was shadowed by the quartz crystal, preventing Au from reaching the sample. The evaporation was therefore repeated; however, since a 5 nm Cr layer had already been deposited during the first evaporation, the final Cr thickness was doubled.
STEP 2
| Spin&bake | |
|---|---|
| AR.P 6200.13 | 2000 RPM, 150°C, 1' |
| EBL |
|---|
| EHT: 30 kV |
| D: 140 \(\mu\)C/cm\(^2\) |
| step-size: 20 nm |
| RIE |
|---|
| \(SF_6\)/\(O_2\): 32/8 sccm |
| 50 W, P = \(5 \times 10^{-2}\) mbar |
STEP 3
| KOH etching |
|---|
| 60-80°C for 15 min |